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S.I.S. develops, manufactures and distributes advanced atomic force/scanning probe microscopy (AFM/SPM) systems for numerous applications in materials research, including semiconductors, data storage, electronic materials, solar cells, polymers and catalysts.
According to the company, S.I.S. will be renamed Bruker Nano GmbH and will operate under its previous management.
Dr. Frank Burgaezy, Bruker AXS Executive Vice President, commented: "The new Bruker high-performance AFM products range from small bench-top AFM systems, to integrated high-end AFM/optical microscope combinations, all the way to large floor standing instruments for the characterization of 300mm wafers in clean room environments. The impressive S.I.S. core technology consists of extremely compact AFM/SPM components which can be used easily with many instruments such as optical microscopes or micro-hardness testers. We are very pleased to have S.I.S. join the Bruker group, and further enhance our extensive high-performance materials research and QC product lines."
"The most widely distributed S.I.S. product is the ULTRAObjective, an extremely compact AFM add-on unit which can be easily integrated with standard optical microscopes. This straightforward integration provides direct access to the nanoworld, without compromise," added S.I.S. Managing Director Dr. Frank Saurenbach.
The PicoStation system is an AFM/SPM stand-alone instrument achieving atomic resolution. With optional upgrades, the functionality can be expanded to a full-fledged AFM/SPM research tool. The options range from non-contact, MFM/EFM and force spectroscopy modes to measurements of friction and adhesion properties, all the way to resistance/work function characterization. A liquid immersion system is also available, the company said.
Combined with the optics of a research-grade optical microscope, the NanoStation II is a high performance inspection system. This robust instrument provides resolution in the sub-nanometer range and accepts various sample sizes. The easy handling of both the optical inspection and the AFM tool makes the NanoStation II a workhorse in every lab where accuracy, stability and reliability are of concern.
With the NanoStation HD, according to the company, Bruker now provides an AFM inspection tool that provides resolution in the sub-Angstrom range and operates with under automation. Initially developed for the routine characterization of defects on hard disks, the NanoStation HD has evolved to a widely used premium AFM in various industrial applications. It allows preselecting multiple scanning locations with the integrated optical microscope, and subsequently running fully automatic AFM measurements. With its macro-programming capability, the user can even implement measurement cycles and methods.
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